发明名称 Modulating surface morphology of barrier layers
摘要 A process for fabricating electronic devices which includes the steps of providing a structure that includes a substrate with an overlying dielectric layer having one or more contact holes and/or vias formed therein; depositing a barrier layer over the structure so that the barrier layer penetrates into the contact holes and/or vias; plasma etching the deposited barrier layer so as to modify its surface morphology; and after modifying the surface morphology of the deposited barrier layer, depositing a metalization layer over the barrier layer. A two-step preclean to facet upper corners of the holes and/or vias and to clean bottoms of the holes and/or vias is performed prior to the deposition of the barrier layer.
申请公布号 US5956608(A) 申请公布日期 1999.09.21
申请号 US19960667842 申请日期 1996.06.20
申请人 APPLIED MATERIALS, INC. 发明人 KHURANA, NITIN;GUO, TED
分类号 H01L21/768;(IPC1-7):H01L21/28;H01L21/306 主分类号 H01L21/768
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