发明名称 Optical profilometer combined with stylus probe measurement device
摘要 An optical profilometer and a stylus probe measuring device used in the same instrument have the advantage that these two sensors can be quickly switched between each other. This can be an advantage when used to measure samples, since the optical profilometer can be used until a sample is found to be outside of the desired tolerances. Afterwards, the stylus probe measuring device can be used to accurately determine the profile data. This is an advantage because an optical profilometer is relatively quick, and the stylus probe measuring device is relatively accurate. Additionally, since the optical profilometer and stylus probe device are in the same instrument, the X and Y positions of these devices can be interrelated accurately. This allows images to be produced where the positions on the images can be easily correlated. For example, measurement cursors in sensor data displays can correlated by the positional offset information.
申请公布号 US5955661(A) 申请公布日期 1999.09.21
申请号 US19970779087 申请日期 1997.01.06
申请人 KLA-TENCOR CORPORATION 发明人 SAMSAVAR, AMIN;WEBER, MICHAEL;MCWAID, THOMAS;KUHN, WILLIAM P.;PARKS, ROBERT E.
分类号 G01B21/30;G01B11/00;G01B21/04;G01Q30/02;G01Q60/24;(IPC1-7):G01B5/28 主分类号 G01B21/30
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