| 摘要 |
A method and apparatus for reconfiguring an integrated circuit based on testing results is accomplished by an integrated circuit that includes a first circuit, a second circuit, and configuration circuitry deposited on a single die. After testing of the die, the configuration circuitry configures the integrated circuit based on the results of the testing. If both circuits passed the testing, the configuration circuitry couples, where appropriate, the first and second circuits together. If, however, the first circuit failed the testing and the second circuit passed the testing, the configuration circuitry configures the integrated circuit as if only the second circuit were present on the die. If, however, the second circuit failed the testing and the first circuit passed the testing, the configuration circuitry configures the integrated circuit as if only the first circuit were present on the die.
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