| 摘要 |
In a programmable integrated circuit such as a field programmable gate array (see FIG. 6), a programming driver is coupled to one end of a programming conductor and a test transistor/test antifuse structure is coupled to the other end of the programming driver. To test the continuity of the programming conductor, the test transistor is controlled to be conductive. If the programming driver can drive an adequately large amount of programming current through the length of the programming conductor to the conductive test transistor and the test antifuse such that the test antifuse programs, then it is determined that the programming conductor has adequate continuity. In some embodiments a second test transistor that should be permanently nonconductive is disposed in parallel with the test antifuse.
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