| 摘要 |
FIELD: computer engineering. SUBSTANCE: data processing device has integrated circuit incorporating processor unit kernel and sweep circuit. Processor unit kernel can execute program commands using either clock signal of system or test clock signal. Required clock signal is recognized due to clock selection of bit inside program commands for test mode and clock selection device functions to select mentioned clock signal and to pass it to processor unit kernel. EFFECT: improved efficiency of processor unit kernel test procedure. 9 cl, 2 dwg
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