发明名称 Temperature measuring device for process metrology
摘要 The device has a measuring unit (2) with an evaluation device (3). The measuring unit has a temperature sensor. The evaluation device contains the main electrical and electronic components and has a display or an adjuster. The measuring device is constructed in a modular fashion. The measuring unit and the evaluation device are electrically and mechanically releasably connected using standard interfaces.
申请公布号 DE19808878(A1) 申请公布日期 1999.09.16
申请号 DE19981008878 申请日期 1998.03.03
申请人 IFM ELECTRONIC GMBH 发明人 KATHAN, BENNO;KREIS, STEFAN;MUELLER, HANS-PETER
分类号 G01K1/14;(IPC1-7):G01D21/00;G01K13/00;H01R13/621 主分类号 G01K1/14
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