发明名称 |
Temperature measuring device for process metrology |
摘要 |
The device has a measuring unit (2) with an evaluation device (3). The measuring unit has a temperature sensor. The evaluation device contains the main electrical and electronic components and has a display or an adjuster. The measuring device is constructed in a modular fashion. The measuring unit and the evaluation device are electrically and mechanically releasably connected using standard interfaces.
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申请公布号 |
DE19808878(A1) |
申请公布日期 |
1999.09.16 |
申请号 |
DE19981008878 |
申请日期 |
1998.03.03 |
申请人 |
IFM ELECTRONIC GMBH |
发明人 |
KATHAN, BENNO;KREIS, STEFAN;MUELLER, HANS-PETER |
分类号 |
G01K1/14;(IPC1-7):G01D21/00;G01K13/00;H01R13/621 |
主分类号 |
G01K1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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