发明名称 |
Memory cell arrangement |
摘要 |
The arrangement has a semiconductor substrate (2). MOS transistors with a floating gate electrode and a control gate electrode are provided as memory cells in the substrate. Each floating gate electrode (9) is arranged in a groove (7) in a main surface (1) of the substrate. The grooves are bounded by one source/drain region of the MOS transistor. The control gate electrode extends over the gate electrode on the side furthest from the source/drain region. At least part of a channel region of the MOS transistor, between the grooves and a second source/drain region of the MOS transistor, is bounded by the main surface. The control gate electrode is arranged above the part of the channel region bounded by the main surface.
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申请公布号 |
DE19811080(A1) |
申请公布日期 |
1999.09.16 |
申请号 |
DE19981011080 |
申请日期 |
1998.03.13 |
申请人 |
SIEMENS AG |
发明人 |
HOFMANN, FRANZ;WILLER, JOSEF;KRAUTSCHNEIDER, WOLFGANG |
分类号 |
H01L21/336;H01L29/423;H01L29/788;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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