MOMENT-BASED METHOD AND SYSTEM FOR EVALUATION OF THE RELIABILITY OF A METAL LAYER IN AN INTEGRATED CIRCUIT

摘要

A moment-based method and system for evaluation of metal layer transient currents in an integrated circuit provides a computationally efficient evaluation of transient current magnitudes through each interconnect in the metal layer. The determinable magnitudes include peak, rms and average current, which can be used in subsequent reliability analyses. Interconnect path nodes are traversed and circuit moments are either retrieved from a previous interconnect delay analysis or are computed. For each pair of nodes, current moments are computed from the circuit moments. The average current is computed from the zero-order circuit momentand the peak and rms currents are obtained from expressions according to a lognormal or other distribution shape assumption for the current waveform at each node.