发明名称 STRESS ENHANCED CMOS CIRCUITS
摘要 A CMOS circuit is provided that includes a PMOS transistor, an NMOS transistor adjacent the PMOS transistor in a channel width direction, a compressive stress liner overlying the PMOS transistor, and a tensile stress liner overlying the NMOS transistor. A portion of the compressive stress liner and a portion of the tensile stress liner are in a stacked configuration, and an overlap region of the compressive stress liner and the tensile stress liner is sufficient to result in an enhanced transverse stress in the compressive stress liner or the tensile stress liner.
申请公布号 US2009008718(A1) 申请公布日期 2009.01.08
申请号 US20080199659 申请日期 2008.08.27
申请人 ADVANCED MICRO DEVICES, INC. 发明人 PEI GEN;LUNING SCOTT D.;VAN MEER JOHANNES
分类号 H01L27/092 主分类号 H01L27/092
代理机构 代理人
主权项
地址