Probe card of semiconductor device test apparatus and method for positioning correction of probe block in the probe card,申请号KR20070041992-传众专利搜索

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发明名称	Probe card of semiconductor device test apparatus and method for positioning correction of probe block in the probe card
摘要
申请公布号	KR100906345(B1)	申请公布日期	2009.07.06
申请号	KR20070041992	申请日期	2007.04.30
申请人		发明人
分类号	H01L21/68;H01L21/66	主分类号	H01L21/68
代理机构		代理人
主权项
地址

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