| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which check bits are buried enabling decision of the normal/abnormal conduction of a built-in ROM to be tested in a semiconductor integrated circuit without outputting an expected value and compression result each outside, and in which increase of the chip area is small. SOLUTION: This semiconductor integrated circuit 11 has a ROM part 12 which consists of a ROM cell 14 and its peripheral circuits, and incorporates in the ROM part 12 a compression means 15 which compresses ROM data read out from the ROM cell 14; at the last address of the ROM cell 14, check bits 15 which are for deciding normal/abnormal condition of the ROM data; are incorporated the compression result of the ROM data is added with the check bits 15 and recomposed into a single data value, with the value of this decompressed result outputted as the signal of the decision result of the normal/ abnormal conduction; and then, a specific value, at which the recomposed result of the compressed value of the normal ROM data becomes a normal decision result signal, is determined by preliminarily calculating backward with a theoretical simulator and used for the check bits 15. |
