发明名称 MICROCMUTER AND BURN-IN TEST METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To execute a burn-in test at a microcomputer in simple configuration and to generate a stable test pattern. SOLUTION: A microcomputer 101 is composed of a ROM 101a in which a test pattern generating program and a measured data compressing program are stored, a RAM 101b in which measured data are stored while being compressed, CPU 101c for executing the test pattern generating program and measured data compressing program, and an input/output interface circuit 101e for inputting a control signal and outputting the measured data while being connected with an external interface 102 of a burn-in board 100.
申请公布号 JPH11242610(A) 申请公布日期 1999.09.07
申请号 JP19980043090 申请日期 1998.02.25
申请人 NEC CORP 发明人 AJIRO KAZUYOSHI
分类号 G06F11/22;G06F11/24;G06F11/267;G06F11/273 主分类号 G06F11/22
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