发明名称 Production and test socket for ball grid array semiconductor package
摘要 A test socket for ball grid array packages (BGA) for integrated circuits is described. The socket includes a basket or cradle shaped to receive the balls of the BGA in individual electrically conductive receptacles. The receptacles have flexible walls and an elastomer disposed outside the walls. The BGA, carrying the balls is urged in a direction parallel to the plane of the BGA thereby carrying the basket in the same direction. A stop is provided to limit the movement of the basket so that further movement of the BGA causes compression of the elastomer so as to provide an electrical connection between each ball and its associated receptacle despite any minor differences in the sizes or locations of the individual balls. Means are provided for connecting each of the receptacles to an external circuit.
申请公布号 US5947751(A) 申请公布日期 1999.09.07
申请号 US19980054937 申请日期 1998.04.03
申请人 VLSI TECHNOLOGY, INC. 发明人 MASSINGILL, THOMAS J.
分类号 G01R1/04;G01R1/067;H05K3/32;(IPC1-7):H01R9/09 主分类号 G01R1/04
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