发明名称 Transistor and method of forming the same
摘要 A crystalline silicon thin film transistor having an LDD (lightly doped drain) structure and a process for fabricating the same, which comprises introducing a catalyst element for accelerating crystallization at a concentration of 1x1015 cm-3or more but less than 2x1019 cm-3 to the impurity region in an amorphous silicon film, crystallizing the amorphous film thereafter, and after forming gate electrode and gate insulating film, implanting an impurity in a self-aligned manner to establish an LDD structure.
申请公布号 US5946560(A) 申请公布日期 1999.08.31
申请号 US19970889760 申请日期 1997.07.10
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 UOCHI, HIDEKI;TAKEMURA, YASUHIKO
分类号 H01L21/265;H01L21/20;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/265
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