发明名称 |
Transistor and method of forming the same |
摘要 |
A crystalline silicon thin film transistor having an LDD (lightly doped drain) structure and a process for fabricating the same, which comprises introducing a catalyst element for accelerating crystallization at a concentration of 1x1015 cm-3or more but less than 2x1019 cm-3 to the impurity region in an amorphous silicon film, crystallizing the amorphous film thereafter, and after forming gate electrode and gate insulating film, implanting an impurity in a self-aligned manner to establish an LDD structure.
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申请公布号 |
US5946560(A) |
申请公布日期 |
1999.08.31 |
申请号 |
US19970889760 |
申请日期 |
1997.07.10 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
UOCHI, HIDEKI;TAKEMURA, YASUHIKO |
分类号 |
H01L21/265;H01L21/20;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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