Digital control cathode ray tube test system

摘要

A digital control CRT test system allows the testing of a CRT and various peripheral components thereof to be digitally controlled and supervised by a microprocessor. The test system comprises at least a microprocessor and at least a nonvolatile memory unit for storing at least a test parameter data set representative of a test setting for the CRT part under testing. Digital to analog converters in conjunction with analog test instruments are used to set the CRT part under testing in accordance with the test parameter data set stored in the nonvolatile memory unit. Further, analog to digital converters are used to convert the analog response signal indicative of whether the CRT part under testing is in good condition into digital form readable by the microprocessor. The microprocessor is able to generate accordingly a report indicative whether the CRT part under testing is in good condition.