发明名称 Method of making a semiconductor device
摘要 A method of making a semiconductor device include forming: (a) a semiconductor substrate on whose surface an integrated circuit is formed, (b) a first insulating layer on the semiconductor device and having first contact holes which lead to the integrated circuit, (c) a capacitance element on the first insulating layer, (d) a second insulating layer on the first insulating layer to cover the capacitance element, and having second contact holes which lead to an upper and a lower electrodes of the capacitance element respectively, and (e) interconnections which are connected to the integrated circuit and the capacitance element respectively through the first and second contact holes. The hydrogen density of this semiconductor device is 1011 atoms/cm2 or less.
申请公布号 US5943568(A) 申请公布日期 1999.08.24
申请号 US19970811664 申请日期 1997.03.05
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 FUJII, EIJI;INOUE, ATSUO;ARITA, KOJI;NASU, TORU;MATSUDA, AKIHIRO
分类号 H01L27/04;H01L21/02;H01L21/3105;H01L21/324;H01L21/768;H01L21/822;H01L27/10;(IPC1-7):H01L21/824 主分类号 H01L27/04
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