发明名称 LED array alignment mark, method and mask for forming same, and LED array alignment method
摘要 An alignment mark on a light-emitting diode (LED) array chip is formed together with the light-emitting areas of the diodes in the array, by use of a combined mask having a first part and a second part. An impurity is introduced through windows in the first part to form the light-emitting areas. Next the windows are covered with an etching resist, and the chip substrate is etched to create a topographic relief feature defined by the second part of the mask. This topographic relief feature is used as an alignment mark. When LED array chips having these alignment marks are mounted on a supporting surface, they are aligned by recognizing patterns of light reflected from the topographic relief, thereby detecting the positions of the alignment marks.
申请公布号 US5943586(A) 申请公布日期 1999.08.24
申请号 US19960768184 申请日期 1996.12.17
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 KOIZUMI, MASUMI;NAKAMURA, YUKIO;NOBORI, MASAHARU;YAMANAKA, AYA
分类号 B41J2/44;B41J2/45;B41J2/455;B41J21/16;B41J25/20;H05K13/04;(IPC1-7):H01L21/76 主分类号 B41J2/44
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