发明名称 |
Apparatus for EMC testing of electrical devices |
摘要 |
In an apparatus for EMC testing of electrical devices, conductors are arranged at opposite sides of a chamber of conductive material at a spacing from and parallel to the chamber walls. These conductors form a symmetrical double line and are fed out of phase at one end by a radio frequency source. They are electrically connected to the chamber walls at the other end via terminating impedances.
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申请公布号 |
US5942903(A) |
申请公布日期 |
1999.08.24 |
申请号 |
US19960754153 |
申请日期 |
1996.11.22 |
申请人 |
ROHDE & SCHWARZ GMBH & CO. KG |
发明人 |
DANZEISEN, KLAUS;GOEPEL, KLAUS-DIETER;SCHMIDT, WERNER |
分类号 |
G01R29/08;G01R29/10;G01R31/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R29/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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