发明名称 Apparatus for EMC testing of electrical devices
摘要 In an apparatus for EMC testing of electrical devices, conductors are arranged at opposite sides of a chamber of conductive material at a spacing from and parallel to the chamber walls. These conductors form a symmetrical double line and are fed out of phase at one end by a radio frequency source. They are electrically connected to the chamber walls at the other end via terminating impedances.
申请公布号 US5942903(A) 申请公布日期 1999.08.24
申请号 US19960754153 申请日期 1996.11.22
申请人 ROHDE & SCHWARZ GMBH & CO. KG 发明人 DANZEISEN, KLAUS;GOEPEL, KLAUS-DIETER;SCHMIDT, WERNER
分类号 G01R29/08;G01R29/10;G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R29/08
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