发明名称 Test probe for a measuring instrument and tester incorporating the test probe
摘要 There are provided a test probe for a measuring instrument, and a tester incorporating the test probe. The test probe includes a probe, a lead wire, a grip and a lead wire-holding piece. A probe for being brought into contact with a measuring object has a proximal end. A lead wire has one end thereof connected to a main unit of the measuring instrument and the other end thereof connected to the probe. A grip protects a portion connecting the probe and the lead wire. The grip is engaged with the proximal end of the probe. A lead wire-holding piece fixedly holds a distal end of the covered portion of the lead. The grip has a retaining portion engaged with the lead wire-holding piece for preventing the lead wire from being drawn out from the grip. In another form, the test probe has a crimp contact for connecting the proximal end of the probe and an uncovered portion of the lead wire. The grip protects a portion connecting the probe and the lead wire, including the crimp contact. The grip is fixedly engaged with the proximal end of the probe.
申请公布号 US5942701(A) 申请公布日期 1999.08.24
申请号 US19980021808 申请日期 1998.02.11
申请人 SEIKO EPSON CORPORATION 发明人 KAMIYA, MANABU
分类号 G01R1/06;G01R1/067;G01R1/073;G01R15/12;H01R11/18;H01R13/58;(IPC1-7):G01D21/00 主分类号 G01R1/06
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