System for detecting open circuits with a measurement device

摘要

A system for detecting open circuits is presented. The system comprises first and second digital-to-analog converters (DACs). The DACs, in combination with a microprocessor, generate a tri-state voltage which is fed through the system. This tri-state voltage is then attenuated via an amplifier. A probe carries an external attenuation signal via a measurement line through the system to be summed with the attenuated tri-state voltage to create Vwts. An analog-to-digital converter then compares Vwts with a known signal to determine whether the circuit under test is open.