发明名称 |
Semiconductor device copper wiring production especially for highly integrated power semiconductor device |
摘要 |
A semiconductor device wiring is formed by melting a thin copper film (30), applied on an insulating layer (20) with a trench (21), in a halogen-containing atmosphere. Preferred Features: The halogen is selected from fluorine, chlorine, bromine and iodine. Fluorine or chlorine is implanted in the gaseous state. Bromine or iodine is supplied in liquid form and is converted to the gaseous state using a bubbler or using liquid MFC and an evaporator.
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申请公布号 |
DE19843173(A1) |
申请公布日期 |
1999.08.19 |
申请号 |
DE1998143173 |
申请日期 |
1998.09.21 |
申请人 |
LG SEMICON CO. |
发明人 |
LEE, SEUNG-YUN;HWANG, YONG-SUP;PARK, CHONG-OOK;KIM, DONG-WON;RHA, SA-KYUN;KIM, JUN-KI |
分类号 |
H01L21/28;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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