发明名称 |
Method for testing printed circuit cards |
摘要 |
The method applies to printed circuit cards (1) with which the contact points (3a-3f) for the tracks (2) can be contacted in turn through test probes according to a test program. The cards are divided into a number of test zones, each containing a fraction of the contact points. All or at least some of the test zones can be tested in parallel.
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申请公布号 |
DE19821225(A1) |
申请公布日期 |
1999.08.19 |
申请号 |
DE19981021225 |
申请日期 |
1998.05.12 |
申请人 |
LUTHER & MAELZER GMBH |
发明人 |
GRUYTER, FALKO DE;HIGGEN, HANS-HERMANN |
分类号 |
G01R31/28;(IPC1-7):G01R31/28;H05K13/08 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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