发明名称 |
METHOD OF PRODUCING SEMICONDUCTOR DEVICE AND HEAT TREATING APPARATUS |
摘要 |
A method of producing a semiconductor device for annealing stably a wafer without causing any harmful effect, such as thermal stress, in an insulating wafer and a semiconductor thin film formed on the insulating wafer and a heat treating apparatus are disclosed. The method for heat-treating a wafer (1) on which an amorphous silicon film (2) is formed comprises a heating step at which the wafer (1) is preheated by irradiating one side of the wafer (1) with intermediate infrared radiation (100) having a wavelength band of 2.5 to 5 mu m, and a heat-treating step at which the amorphous silicon film (2) is annealed and crystallized at above 800 DEG C and below 1000 DEG C by irradiating the other side with near infrared radiation (200) having a wavelength band of below 2.5 mu m.
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申请公布号 |
WO9941777(A1) |
申请公布日期 |
1999.08.19 |
申请号 |
WO1999JP00558 |
申请日期 |
1999.02.09 |
申请人 |
SEIKO EPSON CORPORATION;GYODA, KOZO |
发明人 |
GYODA, KOZO |
分类号 |
H01L21/00;H01L21/20;(IPC1-7):H01L21/20;H01L21/26 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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地址 |
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