发明名称 Semiconductor device with gate electrodes having conductive films
摘要 First and second gate electrodes are formed spaced from each other on a semiconductor substrate. A pair of impurity diffusion layers are provided on both sides of the first gate electrode at the surface of the semiconductor substrate. The first gate electrode includes a first lower conductive film, a first protective conductive film provided on the first lower conductive film, and a first upper conductive film provided on the first protective conductive film. The second gate electrode includes a second lower conductive film, a second protective conductive film provided on the second lower conductive film, and a second upper conductive film provided on the second protective conductive film. The second upper conductive film extends to be in contact with one of the pair of impurity diffusion layers.
申请公布号 US5939758(A) 申请公布日期 1999.08.17
申请号 US19970862650 申请日期 1997.05.23
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ARIMA, SATOSHI
分类号 H01L21/28;H01L21/3213;H01L21/768;H01L21/8244;H01L27/11;H01L29/49;(IPC1-7):H01L29/76;H01L29/94;H01L31/113;H01L31/119 主分类号 H01L21/28
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