发明名称 Thin film materials for the preparation of attenuating phase shift masks
摘要 The fabrication of transmissive attenuating types of phase shift masks by formation of and selective etch of a layer, deposited on a substrate. This single layer provides both the phase shift and the attenuation required and is readily patterned and processed to produce attenuating phase shift masks. Materials suitable for the phase shift layer include, but are not limited to, a layer comprising silicon, nitrogen and carbon; and, a layer comprising silicon, oxygen and molybdenum.
申请公布号 US5939225(A) 申请公布日期 1999.08.17
申请号 US19960693815 申请日期 1996.07.15
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DOVE, DEREK BRIAN;SHIH, KWANG KUO
分类号 G03F1/08;C23C14/06;G03F1/00;G03F9/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/08
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