发明名称 Synchronous semiconductor memory device including internal clock signal generation circuit that generates an internal clock signal synchronizing in phase with external clock signal at high precision
摘要 In an internal clock signal generation circuit, a phase comparator for detecting phase difference between an external clock signal and an internal clock signal includes a transistor and a capacitor with respect to a signal line through which a clock signal corresponding to the external clock signal is transmitted, and a transistor and a capacitor with respect to a signal line through which a clock signal corresponding to the internal clock signal is transmitted. The rising timing of the signal having a more lagging phase of the signals of the two signal lines becomes more gentle. As a result, the phase difference is increased, and the phase comparator can compare the phase at high precision.
申请公布号 US5940344(A) 申请公布日期 1999.08.17
申请号 US19980053058 申请日期 1998.04.01
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;MITSUBISHI ELECTRIC ENGINEERING COMPANY LIMITED 发明人 MURAI, YASUMITSU;SAKAMOTO, WATARU;IWAMOTO, HISASHI
分类号 G11C11/407;G11C7/22;(IPC1-7):G11C8/00 主分类号 G11C11/407
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