发明名称 SYSTEM FOR MEASURING THE REFRACTIVE INDEX PROFILE OF OPTICAL COMPONENTS
摘要 A system for measuring the refractive index profile of optical components using a monochromatic radiation source and an acousto-optical modulator, which is driven by a periodically varying frequency. The modulator emits a first beam having the same wavelength as the source, and a second beam whose wavelength and emission direction vary with the modulating frequency. After the second beam has been collimated, radiation from both beams is directed towards a component under test and an electrical signal having varying frequency is generated representing of the beat between radiation from the two beams exiting from the component. A spectral analysis of the beat signal is performed, the refractive index value being derived from the position taken by the various frequencies of the beat signal on a detection plane.
申请公布号 CA2053724(C) 申请公布日期 1999.08.17
申请号 CA19912053724 申请日期 1991.10.18
申请人 发明人 COCITO, GIUSEPPE;GREGO, GIORGIO
分类号 G01J9/04;G01N21/41;(IPC1-7):G01M11/02 主分类号 G01J9/04
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