发明名称 OPTICAL PROBE FOR NEAR FIELD
摘要 <p>PROBLEM TO BE SOLVED: To provide an optical prove for near field with a micro-opening for generation and/or scattering of the near-by field, capable of increasing the intensity of the near field to be generated and/or scattered and easily form a proper array in use for an optical memory head. SOLUTION: This optical probe includes a plane lens 5 with a small lens arranged on a plane substrate 1 in which an inversely conical hole is formed with its top as a micro-opening 3 and a light source 4 disposed thereon to inlet light into the plane lens 5. As the plane lens 5 is arranged with its focal point to be located at the micro-opening 3, light delivered from the light source can be efficiently converged at the micro-opening. Such a structure, in which array and mass production are possible with a silicon process, is suitably used for an optical memory head.</p>
申请公布号 JPH11223638(A) 申请公布日期 1999.08.17
申请号 JP19980024801 申请日期 1998.02.05
申请人 SEIKO INSTRUMENTS INC 发明人 MITSUOKA YASUYUKI;CHIBA TOKUO;KASAMA NOBUYUKI;ARAWA TAKASHI;NAKAJIMA KUNIO
分类号 G01B11/30;G01N37/00;G01Q20/02;G01Q60/18;G01Q60/22;G01Q70/02;G01Q70/06;G01Q70/16;G11B7/135;G11B7/22;(IPC1-7):G01N37/00 主分类号 G01B11/30
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