| 摘要 |
<p>Surface defect correction technology for photographic images requires an infrared scan along with a conventional color scan. In the present invention, the additional infrared scan needed for surface defect correction is obtained by adding a line of sensors specific to infrared light to a conventional multilinear color sensor array. The invention teaches a practical mode of distinguishing infrared light using a dichroic prism placed over the sensor. This mode has the additional advantage of placing the infrared-specific sensor line in a displaced focus plane to match conventional lenses. Adding a sensor line to a conventional trilinear sensor array requires a quadrilinear array topology. In addition to the direct quadrilinear topology, the invention teaches a method of obtaining full color image information with only two linear sensor lines by interstitially mixing red and blue sensors on a single sensor line, which, in conjunction with the additional infrared line, results in a conventional trilinear sensor topology with a different filter arrangement.</p> |
