发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE OF THE SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To enable thinning, and improve coplanarity and reliability. SOLUTION: In order to restrain the warpage of a semiconductor package of overcoating structure, when the thermal expansion coefficient of a wiring board 11 is set toαs, the Young's modulus to Es, the thickness set to Hs, the thermal expansion coefficient of a resin layer 13 toαr, the Young's modulus to Er, and the thickness to Hr, respectively and a value of (αr.Er.Hr)/(αs.Es.Hs) to be at least about 0.6. By adopting such a structure, stresses acting on the semiconductor package can be relieved effectively, and the coplanarity of the semiconductor package can be improved.</p>
申请公布号 JPH11220077(A) 申请公布日期 1999.08.10
申请号 JP19980292164 申请日期 1998.10.14
申请人 TOSHIBA CORP 发明人 NAKAZAWA TAKAHITO;SUGIZAKI YOSHIAKI
分类号 H01L23/28;H01L21/56;H01L21/60;H01L23/14;(IPC1-7):H01L23/28 主分类号 H01L23/28
代理机构 代理人
主权项
地址