发明名称 Split gate type transistor memory device
摘要 Split gate type transistor made by the steps of: forming a semiconductor substrate; forming a floating gate electrode over the semiconductor substrates the floating gate electrode having at least one lateral face portion; and nitrating the at least one lateral face portion to form a nitrogen-containing layer.
申请公布号 US5936883(A) 申请公布日期 1999.08.10
申请号 US19970825109 申请日期 1997.03.27
申请人 SANYO ELECTRIC CO., LTD. 发明人 KUROOKA, KAZUMI;FUKASE, KENJI
分类号 G11C16/04;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;(IPC1-7):G11C13/00 主分类号 G11C16/04
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