发明名称 High density flash memory cell and method of forming a line of floating gate transistors
摘要 A method of forming a line for floating gate transistors is described and which includes, providing a substrate having a plurality of discrete field oxide regions, and intervening active area regions therebetween; forming a first alternating series of floating gates over a first alternating series of active area regions; forming a second alternating series of floating gates over a second alternating series of active area regions, the second series of floating gates disposed in spaced, overlapping and partial covering relation relative to the first alternating series of floating gates; forming a layer of dielectric material over the first and second series of floating gates; and forming a control gate layer of electrically conductive material over the layer of dielectric material. The present invention further relates to a memory chip, and die having a line of floating gate transistors formed from the same method.
申请公布号 US5936275(A) 申请公布日期 1999.08.10
申请号 US19970988852 申请日期 1997.12.11
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE, ROGER R.
分类号 H01L21/8247;H01L27/115;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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