发明名称 SINGLE-WAFER LOAD LOCKING DEVICE AND SUBSTRATE CLEANING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a single-wafer load locking device capable of rapidly removing particles and maintaining a substrate clean. SOLUTION: This device has an injection nozzle 40 for blowing off gas from the center of a flange 25 with a nozzle toward the outer periphery of the substrate 1. The spacing between the substrate and a flange inside wall 41 with the nozzle at the outer peripheral part of the substrate 1 is <=3 mm. The device has a discharge port 29A at the center of a substrate table 24. The substrate 1 is inserted into a small chamber formed by the substrate table 24 for hermetically closing the aperture disposed in the upper part of a vacuum vessel 21 from the inner side of the vacuum vessel 21 and the flange 25 with the nozzle for hermetically closing the aperture from the outer side of the vacuum vessel 21. The substrate table 24 descends and normal discharge is executed after the rough evacuation of the small chamber.
申请公布号 JPH11217670(A) 申请公布日期 1999.08.10
申请号 JP19980165211 申请日期 1998.06.12
申请人 JAPAN STEEL WORKS LTD:THE 发明人 TATEYAMA SHOGO;TSUJIKAWA HIROSHI;URYU SHUICHI;OSHITANI KOJI;OGATA YOSHIKI;TAKEMOTO MITSUKI
分类号 B08B5/02;C23C14/56;H01L21/677;H01L21/68;(IPC1-7):C23C14/56 主分类号 B08B5/02
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