发明名称 VISUAL INSPECTION DEVICE AND ITS IMAGE-PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To improve a fine object inspection ability by grasping, so to speak, appearance state being obtained from a multi-stage lighting image in terms of pattern matching. SOLUTION: An image signal from an image sensor 4 is converted to digital data by a conversion part 5 and is stored at a storage 6. A recognition control part 7 inspects a bump based on data obtained from the lighting of lighting devices 3a, 3b, 3c and 3d at each stage stored at the storage 6. An upper-stage image 3a and a lower-stage image 3b are suited for extracting failure of a surface state, and failure around an element, respectively. And another lighting image makes clear frailer classification. For example, when the bump has a projection, the feature does not appear in the image of the upper-stage lighting 3a, but it appears in the image of the middle upper-stage lighting 3b, the middle lower-stage lighting 3c, and the lower-stage lighting 3d. When the bump has a recess and a cut-out, the same shape as a normal bump appears in the image of the middle upper-stage lighting 3b, the middle lower-stage lighting 3c, and the lower-stage lighting 3d, but the features appears in the image of the upper- stage lighting 3a.
申请公布号 JPH11218499(A) 申请公布日期 1999.08.10
申请号 JP19980021641 申请日期 1998.02.03
申请人 HITACHI DENSHI LTD 发明人 TAKEYASU KIYOO;KITAMURA SATORU
分类号 G01B11/00;G01B11/24;G01N21/88;G01N21/94;G06T1/00;G06T7/00;H04N7/18 主分类号 G01B11/00
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