发明名称 METHOD FOR MEASURING INTENSITY DISTRIBUTION OF EVANESCENT LIGHT PENETRATED ON OPTICAL WAVEGUIDE SURFACE
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring a penetrating distance of an evanescent light in the case of propagating an exciting light or a fluorescence from a fluorescent substance through an optical waveguide to be decided in response to the waveguide, the exciting light or the like in a fluorescence analyzer for executing a quantitative determination and a qualitative determination of the substance directly or indirectly restrained on a surface of the waveguide by utilizing the evanescent light. SOLUTION: The method for measuring an intensity distribution of an evanescent light penetrated on a surface of an optical waveguide 1 in a fluorescence analyzer on the surface of the waveguide 1 utilizing the light comprises the steps of (1) forming a film 2 of a uniform thickness having a smaller refractive index than that of a material for constituting the waveguide 1 for transmitting an exciting light and a fluorescence on the surface of the waveguide 1, and uniformly adhering the substance of an object to be analyzed to an outer surface of the film 2, thereby controlling a physical distance between the substance and the surface of the waveguide 1, (2) measuring a fluorescent intensity from the substance, and (3) measuring the intensity by altering only a thickness of the film 2, thereby obtaining a state of changing the intensity according to the thickness of the film 2.
申请公布号 JPH11218491(A) 申请公布日期 1999.08.10
申请号 JP19980022049 申请日期 1998.02.03
申请人 TOSOH CORP 发明人 HAYASHI TOSHINORI;ENOSHIMA TORU;ISHIGURO NORIHIKO
分类号 G01N21/64;G01N21/27;(IPC1-7):G01N21/64 主分类号 G01N21/64
代理机构 代理人
主权项
地址