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发明名称
METHOD AND CIRCUIT FOR TESTING LOGIC LSI
摘要
申请公布号
JPH11218559(A)
申请公布日期
1999.08.10
申请号
JP19980020917
申请日期
1998.02.02
申请人
NEC CORP
发明人
KOBAYASHI MUNENORI
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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