发明名称 Diffusion-enhanced crystallization of amorphous materials to improve surface roughness
摘要 Methods of forming a roughened surface through diffusion-enhanced crystallization of an amorphous material are disclosed. In one aspect, conductive hemispherical grain silicon can be formed through dopant diffusion-enhanced crystallization of one or more layers of amorphous silicon. To further enhance uniformity in the formation of the hemispherical grain silicon, the exposed surface of the amorphous silicon can be seeded before crystallization to further enhance uniformity of the surface structures formed in the hemispherical grain silicon.
申请公布号 US5937314(A) 申请公布日期 1999.08.10
申请号 US19970807443 申请日期 1997.02.28
申请人 MICRON TECHNOLOGY, INC. 发明人 PING, ER-XUAN;THAKUR, RANDHIR
分类号 H01L21/00;H01L21/02;H01L21/20;H01L21/8242;H01L21/84;(IPC1-7):H01L21/20;H01L21/225 主分类号 H01L21/00
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