发明名称 IN-LINE FLUORESCENCE X-RAY FILM THICKNESS MONITOR
摘要 PROBLEM TO BE SOLVED: To reduce size and improve detection efficiency and angle characteristics by arranging a detector having annular detection surface coaxial with X-ray irradiation beam from an end widow type X-ray tube. SOLUTION: The distance to a hard disk (sample) 6 in X-ray generation side is shortened with the use of an end window type X-ray tube 2 and the distance in the detection side is prolonged by using an annular X-ray detector 3 and gaining a solid angle in the arrangement. Primary X-ray 4 radiated from an X-ray tube 2 is collimated to be a specific dimension and irradiated passing through the middle of the detector 3. The detector 3 measures the intensity of fluorescence X-ray (Ni-Kα) 5 using the reflection light from the hard disk 6 and detects the film thickness of non-electrolysis nickel plating applied on the surface of the disk 6. By this, the monitor can be reduced to a dimension of half or less and such line characteristics as angle characteristic and distance characteristic are improved and so the monitor may be placed in-line with small arrangement space and exact and quick monitoring is available.
申请公布号 JPH11218418(A) 申请公布日期 1999.08.10
申请号 JP19980022250 申请日期 1998.02.03
申请人 SEIKO INSTRUMENTS INC 发明人 SATO MASAO
分类号 G01B15/02;G01N23/223;G21K1/00;H01J47/00;(IPC1-7):G01B15/02 主分类号 G01B15/02
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