发明名称 Method of forming lightly doped drain region and heavily doping a gate using a single implant step
摘要 A method of making an IGFET includes providing a semiconductor substrate with an active region, forming a gate over the active region, forming displacement material segments over portions of the active region outside the gate, implanting a dopant into the gate, the displacement material segments and the active region using a single implant step, such that a peak concentration of the dopant is in the gate and the displacement material segments, and a light concentration of the dopant implanted through one of the displacement material segments forms a lightly doped drain region in the active region, and forming a source and a drain wherein the drain includes the lightly doped drain region. In this manner, the lightly doped drain region and heavy doping for the gate can be provided using a single implant step.
申请公布号 US5937302(A) 申请公布日期 1999.08.10
申请号 US19970781092 申请日期 1997.01.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GARDNER, MARK I.;HAUSE, FREDERICK N.
分类号 H01L21/265;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/265
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