发明名称 MOS MEMORY POINT
摘要 PROBLEM TO BE SOLVED: To provide a small-size memory point by a CMOS technology, by modifying gate-well resistance by means of current flowing from the drain and the source to a well, and programming a memory point depending on the state of the gate in the programming stage. SOLUTION: During programming, a well 1 of a MOS transistor is connected to the reference potential. The drain 5 and the source 4 are connected to a source of current so that a space charge region may be expanded along the entire length of the channel, and the drain 5 and the source 4 may be biased so that an avalenche may appear in the opposite direction to the junction between the drain 5 and the source 4. The gate 6 is set to the reference potential when a memory point needs not to be programmed while set to the other potential when the memory point needs to be programmed. Furthermore, a means for detecting whether the impedance between the gate 6 and the well 1 is high or low during reading is installed.
申请公布号 JPH11214538(A) 申请公布日期 1999.08.06
申请号 JP19980315333 申请日期 1998.10.20
申请人 ST MICROELECTRONICS SA 发明人 PAPADAS CONSTANTIN;SCHOELLKOPF JEAN-PIERRE
分类号 H01L27/112;G11C17/16;H01L21/8246 主分类号 H01L27/112
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