发明名称 METHOD AND APPARATUS FOR SEMICONDUCTOR SUBSTRATE WITH ELECTRODE FILM
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing an Si semiconductor substrate with a surface W or WSi2 electrode, while an oxide material is prevented from producing on the surface of the Si substrate. SOLUTION: An Si substrate is put in a vacuum vessel with oxygen and moisture partial pressure of 1×10<-9> Torr or below. A raw gas is fed at a heated state with pressure of 5×10<-8> to 5×10<-4> Torr or below to form a W or WSi2 film as an electrode film on the surface of the Si semiconductor substrate.
申请公布号 JPH11214330(A) 申请公布日期 1999.08.06
申请号 JP19980016561 申请日期 1998.01.29
申请人 MITSUBISHI HEAVY IND LTD 发明人 NISHIMORI TOSHIHIKO;SAKAMOTO HITOSHI;NAKANO KOUJI
分类号 C23C16/14;C23C16/30;H01L21/28;H01L21/285;(IPC1-7):H01L21/285 主分类号 C23C16/14
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