发明名称 |
METHOD AND APPARATUS FOR SEMICONDUCTOR SUBSTRATE WITH ELECTRODE FILM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing an Si semiconductor substrate with a surface W or WSi2 electrode, while an oxide material is prevented from producing on the surface of the Si substrate. SOLUTION: An Si substrate is put in a vacuum vessel with oxygen and moisture partial pressure of 1×10<-9> Torr or below. A raw gas is fed at a heated state with pressure of 5×10<-8> to 5×10<-4> Torr or below to form a W or WSi2 film as an electrode film on the surface of the Si semiconductor substrate.
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申请公布号 |
JPH11214330(A) |
申请公布日期 |
1999.08.06 |
申请号 |
JP19980016561 |
申请日期 |
1998.01.29 |
申请人 |
MITSUBISHI HEAVY IND LTD |
发明人 |
NISHIMORI TOSHIHIKO;SAKAMOTO HITOSHI;NAKANO KOUJI |
分类号 |
C23C16/14;C23C16/30;H01L21/28;H01L21/285;(IPC1-7):H01L21/285 |
主分类号 |
C23C16/14 |
代理机构 |
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代理人 |
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地址 |
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