发明名称 NEGATIVE ELECTRODE BASE AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To provide a negative electrode base having sufficient ion impact resistance, satisfactory electron-emitting characteristic and furthermore satisfactory low-temperature operating characteristic even under high-voltage and high- frequency conditions. SOLUTION: A porous tungsten base is formed through sintering, and the electron emitting material is fused for impregnation in a vacant hole of the porous tungsten base. A scandium oxide thin film and a tungsten thin film are formed in this order on the porous negative electrode base by spattering. An impregnated negative electrode structure 1 provided with the porous negative electrode base 4 is assembled in a cathode-ray tube, and subjected to an activation process at 1,200-1,300 deg.C for 1 to 2 hours. The porous negative electrode base 4 has tungsten, scandium and oxygen in the electron-emitting surface side thereof as well as a scandium thin film. The scandium thin film has a positive density gradient of the scandium atom density in the depth direction from the surface of the electron-emitting surface side.</p>
申请公布号 JPH11213862(A) 申请公布日期 1999.08.06
申请号 JP19980012946 申请日期 1998.01.26
申请人 TOSHIBA CORP 发明人 UDA EIICHIRO;NAKAMURA OSAMU;MATSUMOTO SADAO
分类号 H01J1/28;H01J9/04;(IPC1-7):H01J1/28 主分类号 H01J1/28
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