发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device whereby defectives produced at each manufacturing apparatus can be efficiently sorted out. SOLUTION: A sorter 4 is provided on a manufacturing line. If a defective occurs at each manufacturing apparatus, a lot contg. this defective is forcedly carried to the sorter 4, which then classifies the produced defective by models and houses it to thereby eliminates the need for sorting defective products recovered here and hence the throughput can be improved.</p>
申请公布号 JPH11214474(A) 申请公布日期 1999.08.06
申请号 JP19980015504 申请日期 1998.01.28
申请人 SHARP CORP 发明人 YOKOYAMA KOJI
分类号 H01L21/677;G05B15/02;G05B19/418;H01L21/02;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/677
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