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发明名称
TWO-MODE SURFACE DEFECT TESTING SYSTEM
摘要
申请公布号
EP0932825(A1)
申请公布日期
1999.08.04
申请号
EP19970911694
申请日期
1997.10.15
申请人
ATLAS ELECTRIC DEVICES CO.
发明人
LEE, FREDERICK, H.
分类号
G01N21/57;(IPC1-7):G01N21/00
主分类号
G01N21/57
代理机构
代理人
主权项
地址
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