发明名称 Chemical mechanical polishing apparatus
摘要 A chemical mechanical polishing apparatus is provided which is capable of polishing an essentially non-streaked mirrored surface in a highly efficient manner, and which is capable of achieving a degree of flatness of +/-0.1 mm or less. The apparatus is provided with a polishing plate holder 43 which adheres to a material to be polished 40 and rotates; a plurality of polishing pads 42 which have a diameter smaller than that of the material to be polished 40 and which are disposed in a symmetrical manner about an axle, a mechanism for causing the plurality of polishing pads 42 to rotate individually, a mechanism for causing the plurality of polishing pads 42 to revolve about the axle and a mechanism for causing the polishing pads 42 to move in a transverse and longitudinal manner with respect to the material to be polished 40; the front surfaces of the polishing pads 42 are caused to rub against the surface of the material to be polished, and a polishing slurry is supplied to the center of the front surfaces of the polishing pads 42. The polishing slurry is supplied in a pressurized manner, and uniformity and flatness are thus improved. The polishing slurry is degassed, and by means of this variations in flatness are reduced. A dummy plate which surrounds the periphery of the material to be polished is provided so as to be in the same plane with the surface to be polished.
申请公布号 US5931722(A) 申请公布日期 1999.08.03
申请号 US19970800922 申请日期 1997.02.13
申请人 TADAHIRO OHMI 发明人 OHMI, TADAHIRO;FUJIKI, MAN;TAKADA, JOICHI
分类号 H01L21/304;B24B37/00;B24B37/04;B24B57/02;(IPC1-7):B24B7/04 主分类号 H01L21/304
代理机构 代理人
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