发明名称 Fabrication process of a semiconductor device having a multilayered interconnection structure
摘要 A method of forming a multilayer interconnection structure includes the steps of forming a contact hole in an interlayer insulation film, depositing the contact hole by a conductive plug of a refractory element, applying a sputter-etching process to the interlayer insulation film to form a tapered part at a top part of the contact hole while using the conductive plug as an etching stopper, and filling the tapered part of the contact hole by a conductor material by a sputtering process.
申请公布号 US5933756(A) 申请公布日期 1999.08.03
申请号 US19960730505 申请日期 1996.10.11
申请人 RICOH COMPANY, LTD. 发明人 FUSE, AKIHIRO
分类号 H01L21/768;(IPC1-7):H01L21/441 主分类号 H01L21/768
代理机构 代理人
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