发明名称 |
Method of manufacturing a crown shape capacitor |
摘要 |
The present invention is a method of manufacturing crown shape capacitors for use in DRAM semiconductor memory. The method includes the steps of forming a first polysilicon layer, patterning a photoresist on the first polysilicon layer, etching the first polysilicon layer, using oxygen plasma to strip the photoresist, forming a side wall polymer onto the side walls of the first polysilicon layer, using the side wall polymer as a mask to etch back the first polysilicon layer to form a crown shape structure, removing the side wall polymer, depositing a dielectric layer onto the first polysilicon layer, and depositing a second polysilicon layer onto the dielectric layer.
|
申请公布号 |
US5932115(A) |
申请公布日期 |
1999.08.03 |
申请号 |
US19960642515 |
申请日期 |
1996.05.03 |
申请人 |
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
HO, YU-CHUN;CHENG, MENG-CHAO;LI, PEI-WEN;CHENG, HSU-LI;HUANG, YU-HUA;WU, SHING-HUANG |
分类号 |
H01L21/02;H01L21/8242;(IPC1-7):H01L21/70;H01L27/00 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|