发明名称 Method of manufacturing a crown shape capacitor
摘要 The present invention is a method of manufacturing crown shape capacitors for use in DRAM semiconductor memory. The method includes the steps of forming a first polysilicon layer, patterning a photoresist on the first polysilicon layer, etching the first polysilicon layer, using oxygen plasma to strip the photoresist, forming a side wall polymer onto the side walls of the first polysilicon layer, using the side wall polymer as a mask to etch back the first polysilicon layer to form a crown shape structure, removing the side wall polymer, depositing a dielectric layer onto the first polysilicon layer, and depositing a second polysilicon layer onto the dielectric layer.
申请公布号 US5932115(A) 申请公布日期 1999.08.03
申请号 US19960642515 申请日期 1996.05.03
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 HO, YU-CHUN;CHENG, MENG-CHAO;LI, PEI-WEN;CHENG, HSU-LI;HUANG, YU-HUA;WU, SHING-HUANG
分类号 H01L21/02;H01L21/8242;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L21/02
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