SEMICONDUCTOR HAVING POWER SUPPLY PADS FOR PROBE TEST

摘要

A semiconductor chip having an internal circuit providing a prescribed function is provided. The semiconductor chip includes: a signal pad to be used for input and/or output of a signal to and/or from the internal circuit; a first power supply pad to be used for supplying electric power to the internal circuit both in a mounted condition and in an operational test with a probe; and a second power supply pad to be used for supplying electric power to the internal circuit in the operational test with the probe.