发明名称 PHASE SHIFT MASK AND ITS MANUFACTURING METHOD
摘要 Phase shift masks include axially spaced apart first and second radiation blocking layer patterns and a phase shifting layer pattern between the first and second radiation blocking layer patterns, on a phase shift mask substrate. The first and second axially spaced part radiation blocking layers can define narrow areas of the phase shifting layers so that patterns having fine linewidths and improved resolution can be formed on integrated circuits. Phase shifting masks can be fabricated by forming a first radiation blocking layer pattern on a phase shift mask, blanket forming a phase shifting layer and a second radiation blocking layer, patterning the second radiation blocking layer and patterning the phase shifting layer.
申请公布号 KR100213250(B1) 申请公布日期 1999.08.02
申请号 KR19960045130 申请日期 1996.10.10
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 YOON, HEE-SUN
分类号 G03F1/08;G03F1/00;G03F1/30;G03F1/68;H01L21/027;(IPC1-7):G03F1/00 主分类号 G03F1/08
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