| 摘要 |
<p>A Time-Of-Flight mass spectrometer (1) is configured with a pulsing region (10) and electronic controls to cause the directing of ions to a surface (12) in the Time-Of-Flight pulsing region (10). The population of ions resulting from the collecting of said ions on or near said surface (12) is subsequently accelerated into the Time-Of-Flight tube (17) for mass to charge analysis. Ions produced away from said surface (12) can be directed to the surface (12) with high or low surface collisional energies. Higher energy ion collisions with the surface (12) can result in Surface Induced Dissociation fragmentation and the resulting ion fragment population can be mass analyzed. Mass analysis can be performed prior to directing the ions to the surface allowing MS/MS Time-Of-Flight mass analysis with SID. Ion to surface low energy collisions or soft landings resulting in little or no ion fragmentation provide a means for spatially focusing ions on or near the surface prior to accelerating the surface collected ions into the Time-Of-Flight tube.</p> |
